la236b/i doc. no : qw0905-la236b/i rev : a date : 15- aug. - 2005 data sheet ligitek electronics co.,ltd. property of ligitek only led array
li2340-1 note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. package dimensions part no. la236b/i page 1/4 ligitek electronics co.,ltd. property of ligitek only 25.0min 2.54typ 1.0min +- ?? 0.5typ 3.0 5.0 1.5max -+ 3.850.5 6.0 2.9+0.5 -0.0 3.2 2.54typ 2.5 ?? 0.5typ 3.00.5 3.0 4.5 5.0
luminous intensity @10ma(mcd) spectral halfwidth ??f nm forward voltage @20ma(v) part no material viewing angle 2 c 1/2 (deg) peak wave length f pnm gaasp/gap note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. la236b/i max. 2.6 red diffused orange emitted lens 45 635 1.7 min. 20 8.0 80 min. typ. soldering temperature typical electrical & optical characteristics (ta=25 j ) storage temperature color max 260 j for 5 sec max (2mm from body) -40 ~ +100 tsol tstg j part no. la236b/i page 2/4 absolute maximum ratings at ta=25 j parameter power dissipation peak forward current duty 1/10@10khz reverse current @5v operating temperature forward current 30 ma i f 100 120 -40 ~ +85 t opr ir 10 i fp pd j g a ma mw absolute maximum ratings symbol unit ligitek electronics co.,ltd. property of ligitek only i
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 550 600 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 650 part no. la236b/i 700 750 page 3/4
the purpose of this test is the resistance of the device under tropical for hous. solder resistance test 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test this test intended to see soldering well performed or not. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec thermal shock test high temperature high humidity test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 part no. la236b/i page4/4 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test operating life test the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 reference standard ligitek electronics co.,ltd. property of ligitek only
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